Specialized Scanning Electron Microscope (SEM)

Request For Proposals

General Information

United States
   fbo:sb1341-13-rq-0503
   Oct 1, 2013
   Aug 9, 2013
   Department of Commerce
   English

Goods, Works and Services

Medical equipment, pharmaceuticals and personal care products  

Original Text

      

Please see the attached word document for full solicitation details...


Set-aside code: N/A Place of performance:  100 Bureau Drive Gaithersburg, MD  20899  US Contact: Joni L Laster, Contract Specialist, Phone 301-975-8397, Fax 301-975-8884, Email joni.laster@nist.gov - Todd D Hill, Contracting Officer, Phone 301-975-8802, Fax 301-975-8884, Email todd.hill@nist.gov
Updated on 2013/07/24

The above referenced solicitation is hereby amended to address vendor questions and answers as follows:


Question: Regarding section 4.2, please clarify whether the user intends to use various gases in the SEM (i.e. needs a separate Gas Injection System to be quoted with the microscope), or if the section just refers to the way that the pressure in the chamber is controlled and modified to achieve low vacuum conditions (via introduction of, for example, Nitrogen gas or Water vapor). If a Gas Injection System is to be used, what gases will be used and is the microscope vendor required to supply them?


Answer: There is no plan to use a variety of gases or a gas injection system. The section refers to the operation in low vacuum conditions (water vapor or nitrogen) that is required to ensures the microscope performance with environmental cell in case of microscopic leaks.


Question: Page 14 item 2 - Do these resolution numbers refer to resolution in High-vacuum (like item 1.4 above) or Low Vacuum mode?


Answer: Page 14 item 2 should be amended as follows:


FROM:
2. The Offeror shall report details of low vacuum mode operation, including image resolution at 1Kv and 15 kV, mechanism to switch modes, time required to switch mode, and any limitations or alterations on working distance, beam voltage, beam current and detector operation as a result of mode switching when operating in low vacuum mode. The Offeror shall include digital images to support the following minimum requirements for secondary electron imaging :
≤ 1.5 nanometers resolution at 30.0 keV
≤ 3.0 nanometers resolution at 1.0 keV


TO:
2. The Offeror shall report details of low vacuum mode operation, including image resolution at 1 kV and 15 kV, mechanism to switch modes, time required to switch mode, and any limitations or alterations on working distance, beam voltage, beam current and detector operation as a result of mode switching when operating in low vacuum mode. The Offeror shall include digital images to support the stated image resolution at 1kV and 15 kV for secondary electron imaging.


The due date and time remains unchanged and all responses shall be received not later than 3pm EST, August 2, 2013.


 


 


Set-aside code: N/A Place of performance:  100 Bureau Drive Gaithersburg, MD  20899  US Contact: Joni L Laster, Contract Specialist, Phone 301-975-8397, Fax 301-975-8884, Email joni.laster@nist.gov - Todd D Hill, Contracting Officer, Phone 301-975-8802, Fax 301-975-8884, Email todd.hill@nist.gov
Updated on 2013/07/31

The above referenced solicitation is hereby amended to extend the due date for quotes as follows:

From:  August 2, 2013 @ 3pm EST
To: August 9, 2013 @ 3pm EST


Set-aside code: N/A Place of performance:  100 Bureau Drive Gaithersburg, MD  20899  US Contact: Joni L Laster, Contract Specialist, Phone 301-975-8397, Fax 301-975-8884, Email joni.laster@nist.gov - Todd D Hill, Contracting Officer, Phone 301-975-8802, Fax 301-975-8884, Email todd.hill@nist.gov
Updated on 2013/07/19

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